Invention Grant
- Patent Title: Broad-range current measurement using variable resistance
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Application No.: US14289420Application Date: 2014-05-28
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Publication No.: US09720020B2Publication Date: 2017-08-01
- Inventor: Luc van Dijk , Cornelis Klaas Waardenburg
- Applicant: NXP B.V.
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Agent Rajeev Madnawat
- Main IPC: G01R19/00
- IPC: G01R19/00 ; H03K17/082 ; G01R19/165 ; G01R1/20 ; G01R31/00

Abstract:
An apparatus, method and integrated circuit for broad-range current measurement using variable resistance are disclosed. Embodiments of an apparatus for sensing current through a transistor device may include an interface configured to receive a current from the transistor device for sensing. In an embodiment, the apparatus may also include a sensor component coupled to the interface and configured to receive the current from the transistor device and to generate a responsive sensor voltage, the sensor component comprising an adjustable resistance component, a resistance value of the adjustable resistance component being selectable in response to a level of the current received at the interface.
Public/Granted literature
- US20150346241A1 BROAD-RANGE CURRENT MEASUREMENT USING VARIABLE RESISTANCE Public/Granted day:2015-12-03
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