Invention Grant
- Patent Title: Resist composition and pattern forming process
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Application No.: US15210025Application Date: 2016-07-14
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Publication No.: US09720324B2Publication Date: 2017-08-01
- Inventor: Jun Hatakeyama , Koji Hasegawa
- Applicant: SHIN-ETSU CHEMICAL CO., LTD.
- Applicant Address: JP Tokyo
- Assignee: SHIN-ETSU CHEMICAL CO., LTD.
- Current Assignee: SHIN-ETSU CHEMICAL CO., LTD.
- Current Assignee Address: JP Tokyo
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2015-148563 20150728
- Main IPC: G03F7/004
- IPC: G03F7/004 ; G03F7/30 ; C08F18/20 ; C08F220/28 ; C08F220/60 ; C08F224/00 ; C08F226/02 ; C08F228/02 ; C08F228/06 ; G03F7/039 ; C08F222/40 ; C08F222/20 ; C08F216/14 ; G03F7/16 ; G03F7/20 ; G03F7/32

Abstract:
A resist composition is provided comprising a polymer comprising recurring units (a) having an oxazolidinedione, thioxooxazolidinone, thiazolidinedione or thioxothiazolidinone structure and recurring unit (b1) having an acid labile group-substituted carboxyl group and/or recurring units (b2) having an acid labile group-substituted phenolic hydroxyl group. The resist composition suppresses acid diffusion, exhibits a high resolution, and forms a pattern of satisfactory profile with low edge roughness.
Public/Granted literature
- US20170031243A1 RESIST COMPOSITION AND PATTERN FORMING PROCESS Public/Granted day:2017-02-02
Information query
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