Invention Grant
- Patent Title: 3-D polarimetric imaging using a microfacet scattering model to compensate for structured scene reflections
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Application No.: US14978265Application Date: 2015-12-22
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Publication No.: US09741163B2Publication Date: 2017-08-22
- Inventor: Eric C. Fest
- Applicant: Raytheon Company
- Applicant Address: US MA Waltham
- Assignee: Raytheon Company
- Current Assignee: Raytheon Company
- Current Assignee Address: US MA Waltham
- Agent Eric A. Gifford
- Main IPC: G06T17/00
- IPC: G06T17/00 ; G06T7/60 ; G06T15/20 ; G06T15/50 ; G06T7/00

Abstract:
A system and method for more accurately generating the surface normal calibration maps φ(AoLP) and θ(DoLP,φ) to compensate for structured scene reflections for 3-D polarimetric imaging. This is accomplished using a microfacet scattering model to develop the functional form of a polarized bidirectional reflectance distribution function (BRDF) of the object surface. The ambient radiance is ray traced to the BRDF to create the calibration maps φ(AoLP) and θ(DoLP,φ), which may be combined into a single calibration map θ(DoLP, AoLP). These maps are applied to the AoLP and DoLP images to compute an array of surface normals, which are then mapped to form a 3-D image of the object.
Public/Granted literature
Information query
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06T | 一般的图像数据处理或产生 |
G06T17/00 | 用于计算机制图的3D建模 |