Invention Grant
- Patent Title: Manufacturing method of semiconductor structure
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Application No.: US14818487Application Date: 2015-08-05
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Publication No.: US09741852B2Publication Date: 2017-08-22
- Inventor: Shih-Hsien Huang , Tsang-Hsuan Wang , James Tsai
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsinchu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT, PC
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L29/08 ; H01L29/161 ; H01L29/165 ; H01L29/24 ; H01L29/66

Abstract:
A manufacturing method of a semiconductor structure is provided. The manufacturing method of the semiconductor structure includes the following steps: providing a substrate; forming a gate structure on the substrate; forming a recess in the substrate at a lateral side of the gate structure; performing a pre-bake process at a temperature of 740-840° C. and under a pressure of equal to or higher than 150 torr; and forming an epitaxial buffer layer in the recess.
Public/Granted literature
- US20170040454A1 MANUFACTURING METHOD OF SEMICONDUCTOR STRUCTURE Public/Granted day:2017-02-09
Information query
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