Invention Grant
- Patent Title: Nitride semiconductor substrate having recesses at interface between base substrate and initial nitride
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Application No.: US15202736Application Date: 2016-07-06
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Publication No.: US09748344B2Publication Date: 2017-08-29
- Inventor: Noriko Omori , Hiroshi Oishi , Yoshihisa Abe , Jun Komiyama , Kenichi Eriguchi , Tomoko Watanabe
- Applicant: CoorsTek KK
- Applicant Address: JP Tokyo
- Assignee: COORSTEK KK
- Current Assignee: COORSTEK KK
- Current Assignee Address: JP Tokyo
- Agency: Buchahan Ingersoll & Rooney PC
- Priority: JP2015-136598 20150708; JP2016-105768 20160527
- Main IPC: H01L29/20
- IPC: H01L29/20 ; H01L29/34 ; H01L21/02 ; H01L29/06

Abstract:
The present invention provides a nitride semiconductor substrate having an initial nitride and a nitride semiconductor sequentially stacked on one principal plane of a base substrate, wherein the nitride semiconductor substrate comprises recesses depressed from an interface between the base substrate and the initial nitride toward the base substrate along one arbitrary cross section; the recesses each have a diameter of 6 nm or more and 60 nm or less and are formed at a density of 3×108 pieces/cm2 or more and 1×1011 pieces/cm2 or less; and the recess preferably has a depth of 3 nm or more and 45 nm or less from the interface between the base substrate and the initial nitride toward the base substrate.
Public/Granted literature
- US20170011919A1 NITRIDE SEMICONDUCTOR SUBSTRATE Public/Granted day:2017-01-12
Information query
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