Invention Grant
- Patent Title: System for irradiating charged particles and method for irradiating charged particles
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Application No.: US14726824Application Date: 2015-06-01
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Publication No.: US09750957B2Publication Date: 2017-09-05
- Inventor: Yusuke Fujii , Toru Umekawa , Masumi Umezawa , Hiroki Shirato , Kikuo Umegaki , Naoki Miyamoto , Taeko Matsuura
- Applicant: HITACHI, LTD.
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2011-262978 20111130
- Main IPC: A61N5/00
- IPC: A61N5/00 ; A61N5/10 ; A61B6/04 ; A61B6/03

Abstract:
A charged particle irradiation system is capable of shortening the irradiation time and the treatment time by performing efficient irradiation even when irregular variation occurs in the irradiation object during the gating irradiation. The extraction of the beam is stopped upon reception of a regular extraction permission end signal which is outputted based on a regular movement signal. An extractable state maintaining function operates upon the reception of the extraction permission end signal. When a preset standby time elapses without receiving an extraction permission start signal again during the standby time, the extractable state maintaining function finishes its operation and a charged particle beam generator decelerates the beam. Also, the extraction of the beam is stopped due to reception of an irregular extraction permission end signal during the irradiation. When the extraction permission start signal is received again during the standby time, the extraction of the beam is restarted.
Public/Granted literature
- US20150290475A1 SYSTEM FOR IRRADIATING CHARGED PARTICLES AND METHOD FOR IRRADIATING CHARGED PARTICLES Public/Granted day:2015-10-15
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