Invention Grant
- Patent Title: Thermal flow meter with an asymmetrical inflow-side of circuit package
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Application No.: US14407775Application Date: 2013-05-29
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Publication No.: US09752908B2Publication Date: 2017-09-05
- Inventor: Shinobu Tashiro , Keiji Hanzawa , Noboru Tokuyasu , Takeshi Morino , Ryosuke Doi , Akira Uenodan
- Applicant: Hitachi Automotive Systems, Ltd.
- Applicant Address: JP Hitachinaka-shi
- Assignee: Hitachi Automotive Systems, Ltd.
- Current Assignee: Hitachi Automotive Systems, Ltd.
- Current Assignee Address: JP Hitachinaka-shi
- Agency: Crowell & Moring LLP
- Priority: JP2012-136139 20120615
- International Application: PCT/JP2013/064821 WO 20130529
- International Announcement: WO2013/187224 WO 20131219
- Main IPC: G01F1/684
- IPC: G01F1/684 ; G01F1/696 ; G01F15/14

Abstract:
A thermal flow meter has improved measurement accuracy due to the shape of a circuit package. The circuit package has a measurement surface and a backside of a measurement surface of a rear surface thereof is located in a bypass passage, the bypass passage being configured to allow a measurement target gas to flow therein dividing the measurement target gas into a flow path at a side of the measurement surface and a flow path at a side of the backside of measurement surface of a rear surface thereof. An inflow-side end surface of the circuit package has different shapes at the side of the measurement surface and at the side of the backside of the measurement surface.
Public/Granted literature
- US20150355006A1 Thermal Flow Meter Public/Granted day:2015-12-10
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