Invention Grant
- Patent Title: Method and apparatus for metering a voltage signal
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Application No.: US14785635Application Date: 2013-04-22
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Publication No.: US09753064B2Publication Date: 2017-09-05
- Inventor: Jerome Enjalbert
- Applicant: Jerome Enjalbert
- Applicant Address: US TX Austin
- Assignee: NXP USA, Inc.
- Current Assignee: NXP USA, Inc.
- Current Assignee Address: US TX Austin
- Agent Charlene R. Jacobsen
- International Application: PCT/IB2013/001150 WO 20130422
- International Announcement: WO2014/174334 WO 20141030
- Main IPC: G01N27/416
- IPC: G01N27/416 ; G06G7/12 ; G01R19/22 ; G01R31/36 ; G01R19/25

Abstract:
A voltage metering module for metering a voltage signal at least one analogue to digital converter (ADC) component arranged to receive at an input thereof a voltage signal and to generate a digital signal representative of the received voltage signal. The at least one ADC component includes at least one sampling network controllable to sample the received voltage signal for conversion to a digital signal representative of the received voltage signal and at least one compensation network operably coupled in parallel with the sampling network and controllable to sample the received voltage signal such that an input current of the compensation network at least partially compensates for a component of an input current of the sampling network.
Public/Granted literature
- US20160061867A1 METHOD AND APPARATUS FOR METERING A VOLTAGE SIGNAL Public/Granted day:2016-03-03
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