Invention Grant
- Patent Title: Method and systems for testing an electrical circuit
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Application No.: US14948563Application Date: 2015-11-23
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Publication No.: US09753073B2Publication Date: 2017-09-05
- Inventor: John Douglas Ewen
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Global Patent Operation
- Agent John A. Kramer
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R31/00 ; H01R25/00

Abstract:
Various methods and systems are provided for an electrical testing apparatus for an electrical panel and associated wiring harness. In one embodiment, an electrical testing apparatus includes a common housing; a first connector tethered to the housing via a first plurality of wires extending away from and coupled within the housing, where the first connector is adapted to connect to an electrical panel; a second connector mounted to the housing and adapted to connect to a wiring harness of the electrical panel, the wiring harness including a second plurality of wires; and a third connector mounted to the housing and including a plurality of test points for testing an electrical signal passing through each wire of the second plurality of wires.
Public/Granted literature
- US20170146580A1 METHOD AND SYSTEMS FOR TESTING AN ELECTRICAL CIRCUIT Public/Granted day:2017-05-25
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