Invention Grant
- Patent Title: Inspection apparatus and inspection method
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Application No.: US14782602Application Date: 2014-04-08
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Publication No.: US09753075B2Publication Date: 2017-09-05
- Inventor: Tadashi Takahashi
- Applicant: NIDEC-READ CORPORATION
- Applicant Address: JP Kyoto
- Assignee: NIDEC-READ CORPORATION
- Current Assignee: NIDEC-READ CORPORATION
- Current Assignee Address: JP Kyoto
- Agency: Viering, Jentschura & Partner mbB
- Priority: JP2013-081279 20130409
- International Application: PCT/JP2014/002005 WO 20140408
- International Announcement: WO2014/167838 WO 20141016
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G06F3/044 ; G06F3/047

Abstract:
An inspection apparatus for inspecting wires of an object in which a plurality of x-axis and y-axis wires are arranged perpendicular to each other, each x-axis and y-axis wire having a display wire and tab wire, respectively. The apparatus includes a power supply device supplying an AC signal to the wire as an inspection object; a connecting device being in conductive contact with the tab wire to transmit the AC signal, a first detecting device disposed in a non-contact manner at one end of the display wire and conductively connected to one end of the power supply device, a second detecting device disposed in the non-contact manner and opposed to the display wire and conductively connected to the one end of the power supply device, and a determining device determining quality of the wire on the basis of results of the first and second detecting devices.
Public/Granted literature
- US20160054366A1 INSPECTION APPARATUS AND INSPECTION METHOD Public/Granted day:2016-02-25
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