Invention Grant
- Patent Title: Debug circuit, semiconductor device, and debug method
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Application No.: US14751405Application Date: 2015-06-26
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Publication No.: US09753084B2Publication Date: 2017-09-05
- Inventor: Yutaka Tamiya
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMTIED
- Current Assignee: FUJITSU LIMTIED
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JP2014-192088 20140922
- Main IPC: G01R31/317
- IPC: G01R31/317

Abstract:
A debug circuit, includes: a controller to start a debugging of a circuit based on first and second code values, the first code value obtained by encoding a first sequence included in a processing sequence indicating a condition for a process of the circuit, the second code value obtained by encoding a second sequence subsequent to the first sequence, wherein the controller performs to: calculate a third code value as a current code value based on signals input and output to the circuit; output, as a fourth code value, a previous third code value that is earlier than the current code value; detect the first sequence by comparing a difference between the third code value and the fourth code value with the first code value; calculate a first expected value of the third code value; and perform the process when the third code value and the first expected value match.
Public/Granted literature
- US20160084906A1 DEBUG CIRCUIT, SEMICONDUCTOR DEVICE, AND DEBUG METHOD Public/Granted day:2016-03-24
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