Invention Grant
- Patent Title: Observation system, observation program, and observation method
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Application No.: US14266383Application Date: 2014-04-30
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Publication No.: US09753267B2Publication Date: 2017-09-05
- Inventor: Suguru Dowaki , Shiori Oshima , Eriko Matsui , Tatsutoshi Nakahata , Megumu Saito , Akira Niwa
- Applicant: Sony Corporation , Kyoto University
- Applicant Address: JP Tokyo JP Kyoto
- Assignee: Sony Corporation,Kyoto University
- Current Assignee: Sony Corporation,Kyoto University
- Current Assignee Address: JP Tokyo JP Kyoto
- Agency: K&L Gates LLP
- Priority: JP2013-100142 20130510
- Main IPC: G02B21/36
- IPC: G02B21/36 ; G01N21/65

Abstract:
An observation system includes a microscope optical system, an image pickup unit, an image pickup control unit, a detection unit, and an observation control unit. The image pickup unit is configured to take an image of a field-of-view range of the microscope optical system. The image pickup control unit is configured to cause the image pickup unit to take images of an observation sample in the field-of-view range at a plurality of focal positions and generate detection images. The detection unit is configured to detect a three-dimensional position of an observation target object in the observation sample from the detection images. The observation control unit is configured to fit the field-of-view range of the microscope optical system to the three-dimensional position.
Public/Granted literature
- US20140333723A1 OBSERVATION SYSTEM, OBSERVATION PROGRAM, AND OBSERVATION METHOD Public/Granted day:2014-11-13
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