- Patent Title: Controlling within-die uniformity using doped polishing material
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Application No.: US15160409Application Date: 2016-05-20
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Publication No.: US09754837B1Publication Date: 2017-09-05
- Inventor: Haigou Huang , Jinping Liu , Huang Liu , Taifong Chao
- Applicant: GLOBALFOUNDRIES INC.
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES INC.
- Current Assignee: GLOBALFOUNDRIES INC.
- Current Assignee Address: KY Grand Cayman
- Agency: Hoffman Warnick LLC
- Agent Francois Pagette
- Main IPC: H01L29/15
- IPC: H01L29/15 ; H01L21/8234 ; H01L21/3105 ; H01L21/3115 ; H01L21/02 ; H01L29/66 ; H01L29/78 ; H01L21/285 ; H01L21/8238 ; H01L27/088 ; H01L27/092

Abstract:
Various embodiments include methods and integrated circuit structures. In some cases, a method of forming an integrated circuit structure can include: forming a mask over an oxide layer and an underlying set of fin structures, the set of fin structures including a plurality of fins each having a substrate base and a silicide layer over the substrate base; implanting the oxide layer through an opening in the mask; removing the mask; polishing the oxide layer overlying the set of fin structures after removing the mask to expose the set of fin structures; and forming a nitride layer over the set of fin structures.
Information query
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