Invention Grant
- Patent Title: Semiconductor wafer, method of producing semiconductor wafer and electronic device
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Application No.: US14953567Application Date: 2015-11-30
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Publication No.: US09755040B2Publication Date: 2017-09-05
- Inventor: Takeshi Aoki , Noboru Fukuhara , Hiroyuki Sazawa
- Applicant: SUMITOMO CHEMICAL COMPANY, LIMITED
- Applicant Address: JP Chuo-ku, Tokyo
- Assignee: SUMITOMO CHEMICAL COMPANY, LIMITED
- Current Assignee: SUMITOMO CHEMICAL COMPANY, LIMITED
- Current Assignee Address: JP Chuo-ku, Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2013-114982 20130531
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L29/51 ; H01L29/423 ; H01L29/778 ; H01L21/28 ; H01L29/78 ; H01L21/02

Abstract:
To provide a semiconductor wafer having a wafer, a compound semiconductor layer, a first insulating layer and a second insulating layer, wherein in the depth direction, oxygen atoms and nitrogen atoms are continuously distributed, the number of the nitrogen atoms along the depth direction shows its maximum in the first insulating layer, the total number of third atoms and fourth atoms along the depth direction becomes the largest in the compound semiconductor layer, the number of the oxygen atoms at the interface between the compound semiconductor layer and the first insulating layer is smaller than the number of the oxygen atoms at the interface between the first insulating layer and the second insulating layer.
Public/Granted literature
- US20160079386A1 SEMICONDUCTOR WAFER, METHOD OF PRODUCING SEMICONDUCTOR WAFER AND ELECTRONIC DEVICE Public/Granted day:2016-03-17
Information query
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