Invention Grant
- Patent Title: Charged particle beam system
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Application No.: US14524495Application Date: 2014-10-27
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Publication No.: US09757590B2Publication Date: 2017-09-12
- Inventor: Kazuo Hiramoto , Masumi Umezawa , Shinichiro Fujitaka , Hiroki Shirato , Shinichi Shimizu , Kikuo Umegaki
- Applicant: HITACHI, LTD. , NATIONAL UNIVERSITY CORPORATION HOKKAIDO UNIVERSITY
- Applicant Address: JP Tokyo JP Hokkaido
- Assignee: Hitachi, Ltd.,National University Corporation Hokkaido University
- Current Assignee: Hitachi, Ltd.,National University Corporation Hokkaido University
- Current Assignee Address: JP Tokyo JP Hokkaido
- Agency: Mattingly & Malur, PC
- Priority: JP2013-224765 20131029
- Main IPC: A61N5/10
- IPC: A61N5/10 ; A61N5/00 ; G21K5/04 ; G21K1/08

Abstract:
First ions and second ions that are heavier than first ions are generated in an ion source. One kind of ions of the first ions and second ions is injected into an accelerator by action of a switching magnet and accelerated in the accelerator. An ion beam including the one kind of ions is extracted from the accelerator to a beam transport system and a tumor volume of a patient is irradiated with the ion beam from an irradiation nozzle. In the irradiation of the ion beam, a tumor volume depth and the largest underwater range of each ion species are compared, and an ion species in which the tumor volume depth becomes the longest underwater range or lower is injected into the accelerator, and accelerated by the accelerator. The tumor volume is irradiated with the ion species.
Public/Granted literature
- US20150115179A1 CHARGED PARTICLE BEAM SYSTEM Public/Granted day:2015-04-30
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