Invention Grant
- Patent Title: Panel inspecting apparatus and method
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Application No.: US14712205Application Date: 2015-05-14
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Publication No.: US09759665B2Publication Date: 2017-09-12
- Inventor: Myoung-ki Ahn , Jin-woo Ahn , Tae-yong Jo , Hyeong-min Ahn , Tae-hyoung Lee
- Applicant: Myoung-ki Ahn , Jin-woo Ahn , Tae-yong Jo , Hyeong-min Ahn , Tae-hyoung Lee
- Applicant Address: KR Gyeonggi-Do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-Do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2014-0133553 20141002
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/88 ; G01N21/95

Abstract:
A panel inspecting apparatus and method may accurately inspect image quality of a curved portion of a panel with relatively small inspecting cost and time, and the panel inspecting apparatus may have a relatively simple structure. The panel inspecting apparatus includes a support on which a panel is disposed, a mirror corresponding to a curved area of the panel, a lens configured to receive an image from the panel and an image reflected by the mirror and focus the images, and an image sensor configured to capture the images transferred via the lens.
Public/Granted literature
- US20160097726A1 PANEL INSPECTING APPARATUS AND METHOD Public/Granted day:2016-04-07
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