Invention Grant
- Patent Title: Contact inspection device
-
Application No.: US13936421Application Date: 2013-07-08
-
Publication No.: US09759744B2Publication Date: 2017-09-12
- Inventor: Kentaro Tanaka
- Applicant: Kabushiki Kaisha Nihon Micronics
- Applicant Address: JP Tokyo
- Assignee: KABUSHIKI KAISHA NIHON MICRONICS
- Current Assignee: KABUSHIKI KAISHA NIHON MICRONICS
- Current Assignee Address: JP Tokyo
- Agency: Leason Ellis LLP
- Priority: JP2012-162912 20120723
- Main IPC: G01R31/20
- IPC: G01R31/20 ; G01R1/073 ; G01R1/067

Abstract:
A contact inspection device including contacts that contact with a test object for inspection, each contact having a base end portion, a needle tip portion having a needle tip that contacts with the test object, and an elastically deformable portion located between the base end portion and the needle tip portion, with the base end portion and the needle tip portion having axes which coincide with each other. The elastically deformable portion is deformable under a compressive force applied in the axial direction of the needle tip portion while the needle tip is pressed against the test object and converts the compressive force into a tilting motion of the needle tip portion about the needle tip through deformation. The needle tip portion is displaceable in a direction in which the needle tip portion is pivotally tilted while the needle tip is pressed against the test object.
Public/Granted literature
- US20140021976A1 CONTACT INSPECTION DEVICE Public/Granted day:2014-01-23
Information query