Invention Grant
- Patent Title: Radiation measurement device
-
Application No.: US14892969Application Date: 2013-12-16
-
Publication No.: US09759819B2Publication Date: 2017-09-12
- Inventor: Kazuhiro Eguchi , Kenichi Moteki
- Applicant: Mitsubishi Electric Corporation
- Applicant Address: JP Chiyoda-Ku, Tokyo
- Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee Address: JP Chiyoda-Ku, Tokyo
- Agency: Buchanan Ingersoll & Rooney PC
- Priority: JP2013-164697 20130808
- International Application: PCT/JP2013/083558 WO 20131216
- International Announcement: WO2015/019515 WO 20150212
- Main IPC: G01T1/02
- IPC: G01T1/02 ; G01T1/20 ; G01T1/40

Abstract:
In a radiation measurement device in which respective wave height values of voltage pulses from a radiation detector are made to correspond to radiation energy values and a count that is the number of the voltage pulses is separately generated for each of a plurality of channels corresponding to the wave height values so that a wave height spectrum is generated and a dose of a radiation that has entered the radiation detector is calculated based on the wave height spectrum, based on a count in at least one channel, out of the plurality of channels, that includes a lower limit within a measurement range for the radiation energy value, a dose is corrected by calculating a portion thereof neglected as what is the same as or smaller than a measurement limit, so that a dose of a radiation that has entered the radiation detector is calculated.
Public/Granted literature
- US20160109586A1 RADIATION MEASUREMENT DEVICE Public/Granted day:2016-04-21
Information query