Invention Grant
- Patent Title: Radiation-sensitive resin composition and resist pattern-forming method
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Application No.: US14502024Application Date: 2014-09-30
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Publication No.: US09760004B2Publication Date: 2017-09-12
- Inventor: Hiromu Miyata , Hayato Namai , Masafumi Hori
- Applicant: JSR CORPORATION
- Applicant Address: JP Minato-ku
- Assignee: JSR CORPORATION
- Current Assignee: JSR CORPORATION
- Current Assignee Address: JP Minato-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2013-205725 20130930; JP2014-187118 20140912
- Main IPC: G03F7/038
- IPC: G03F7/038 ; G03F7/039 ; G03F7/004 ; G03F7/11 ; G03F7/20 ; G03F7/32

Abstract:
The present invention relates to a radiation-sensitive resin composition that contains: a compound that has a structure represented by the following formula (1); a first polymer that includes a fluorine atom; and a solvent. In the following formula (1), X represents a carbonyl group, a sulfonyl group or a single bond. Y+ represents a monovalent radiation-degradable onium cation. The first polymer preferably has at least one selected from the group consisting of a structural unit represented by the following formula (2a) and a structural unit represented by the following formula (2b). The first polymer preferably includes an alkali-labile group. The first polymer preferably includes an acid-labile group. It is preferred that a radiation-sensitive acid generator is further contained.
Public/Granted literature
- US20150093703A1 RADIATION-SENSITIVE RESIN COMPOSITION AND RESIST PATTERN-FORMING METHOD Public/Granted day:2015-04-02
Information query
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