Invention Grant
- Patent Title: Method of preparing strain released strip-bent x-ray crystal analyzers
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Application No.: US15275430Application Date: 2016-09-25
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Publication No.: US09761340B2Publication Date: 2017-09-12
- Inventor: Qing Qian
- Applicant: Qing Qian
- Main IPC: H01L31/08
- IPC: H01L31/08 ; H01L31/18 ; G01N23/207 ; G21K1/00

Abstract:
A method of preparing two dimension bent X-ray crystal analyzers in strips feature is provided. A crystal wafer in strips is bonded to a curved substrate which offers the desired focus length. A crystal wafer in strips is pressed against the surface of the substrate forming curved shape by anodic bonding or glue bonding. The bonding is permanently formed between crystal wafer and its substrate surface, which makes crystal wafer has same curvature as previously prepared substrate.
Public/Granted literature
- US20170110621A1 METHOD OF PREPARING STRAIN RELEASED STRIP-BENT X-RAY CRYSTAL ANALYZERS Public/Granted day:2017-04-20
Information query
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