Invention Grant
- Patent Title: Semiconductor wafer, method of producing semiconductor wafer, and heterojunction bipolar transistor
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Application No.: US15187016Application Date: 2016-06-20
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Publication No.: US09761686B2Publication Date: 2017-09-12
- Inventor: Sadanori Yamanaka , Naohiro Nishikawa , Tsuyoshi Nakano
- Applicant: SUMITOMO CHEMICAL COMPANY, LIMITED
- Applicant Address: JP Chuo-ku, Tokyo
- Assignee: SUMITOMO CHEMICAL COMPANY, LIMITED
- Current Assignee: SUMITOMO CHEMICAL COMPANY, LIMITED
- Current Assignee Address: JP Chuo-ku, Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2015-125191 20150622
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L29/00 ; H01L29/66 ; H01L29/737 ; H01L21/02 ; H01L29/207

Abstract:
Techniques are provided that can impart sufficient electrical conductivity to a semiconductor crystal exhibiting low doping efficiency for silicon atoms, such as InGaAs, by implanting only a small amount of silicon atoms. Such a semiconductor wafer may include a first semiconductor crystal layer, a second semiconductor crystal layer exhibiting a conductivity type that is different from the first layer, a third semiconductor crystal layer exhibiting the conductivity type of the first layer and having a larger band gap than the second semiconductor crystal layer, and a fourth semiconductor crystal layer exhibiting the conductivity type of the first layer and having a smaller band gap than the third semiconductor crystal layer. The fourth semiconductor crystal layer contains a first element that generates a first carrier of a corresponding conductivity type and a second element that generates a second carrier of a corresponding conductivity type.
Public/Granted literature
- US20160372569A1 SEMICONDUCTOR WAFER, METHOD OF PRODUCING SEMICONDUCTOR WAFER, AND HETEROJUNCTION BIPOLAR TRANSISTOR Public/Granted day:2016-12-22
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