Invention Grant
- Patent Title: Semiconductor barrier photo-detector
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Application No.: US15454294Application Date: 2017-03-09
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Publication No.: US09761751B2Publication Date: 2017-09-12
- Inventor: Philip Klipstein
- Applicant: Semi Conductor Devices
- Applicant Address: IL Haifa
- Assignee: Semi Conductor Devices
- Current Assignee: Semi Conductor Devices
- Current Assignee Address: IL Haifa
- Agency: Haug Partners LLP
- Agent William S. Frommer
- Priority: IL225872 20130422
- Main IPC: H01L31/0352
- IPC: H01L31/0352 ; H01L31/11 ; H01L27/144 ; H01L31/0304

Abstract:
The present invention discloses a photo-detector comprising: an n-type photon absorbing layer of a first energy bandgap; a middle barrier layer, an intermediate layer is a semiconductor structure; and a contact layer of a third energy bandgap, wherein the layer materials are selected such that the first energy bandgap of the photon absorbing layer is narrower than that of said middle barrier layer; wherein the material composition and thickness of said intermediate layer are selected such that the valence band of the intermediate layer lies above the valence band in the barrier layer to create an efficient trapping and transfer of minority carriers from the barrier layer to the contact layer such that a tunnel current through the barrier layer from the contact layer to the photon absorbing layer is less than a dark current in the photo-detector and the dark current from the photon-absorbing layer to said middle barrier layer is essentially diffusion limited and is due to the unimpeded flow of minority carriers, thus reducing generation-recombination (GR) noise of the photo-detector. The principles of the present invention also apply to inverted polarity structures of the form pBp in which all the doping polarities and band alignments described above are reversed.
Public/Granted literature
- US20170179327A1 SEMICONDUCTOR BARRIER PHOTO-DETECTOR Public/Granted day:2017-06-22
Information query
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