Invention Grant
- Patent Title: Probe for ultrasonic diagnostic apparatus
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Application No.: US15182121Application Date: 2016-06-14
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Publication No.: US09763643B2Publication Date: 2017-09-19
- Inventor: Jin Young Choi
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2011-0133504 20111213
- Main IPC: A61B5/00
- IPC: A61B5/00 ; A61B8/00 ; A61B8/14 ; A61B8/08

Abstract:
A probe for an ultrasonic diagnostic apparatus which is used for performing a test upon a subject is provided. The probe includes a case which forms an exterior of the probe, a piezoelectric object which is provided on an inside of the case and which generates an ultrasonic wave, a sound absorbing layer which is provided at a rear surface of the piezoelectric object and which prevents the ultrasonic wave from being delivered to a rear portion of the piezoelectric object, an acoustic matching layer which delivers the generated ultrasonic wave to a subject by matching a sound impedance of the piezoelectric object with a sound impedance of the subject, and a sound lens which concentrates the generated ultrasonic wave and radiates the concentrated ultrasonic wave toward the subject.
Public/Granted literature
- US20160287212A1 PROBE FOR ULTRASONIC DIAGNOSTIC APPARATUS Public/Granted day:2016-10-06
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