Invention Grant
- Patent Title: Method, system and apparatus for measuring comparatively thick materials
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Application No.: US14496966Application Date: 2014-09-25
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Publication No.: US09766190B2Publication Date: 2017-09-19
- Inventor: Masao Yano , Kanta Ono
- Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHA , INTER-UNIVERSITY RESEARCH INSTITUTE CORPORATION HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION
- Applicant Address: JP Toyota JP Ibaraki
- Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA,INTER-UNIVERSITY RESEARCH INSTITUTE CORPORATION HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION
- Current Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA,INTER-UNIVERSITY RESEARCH INSTITUTE CORPORATION HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION
- Current Assignee Address: JP Toyota JP Ibaraki
- Agency: Oliff PLC
- Priority: JP2013-198163 20130925
- Main IPC: G01N27/72
- IPC: G01N27/72 ; G01N23/06 ; G01N23/04
Abstract:
A method, system and apparatus are provided to measure magnetic characteristics of a comparatively thick magnetic sample in a magnetic field or nonmagnetic field by X-ray magnetic circular dichroism (XMCD). In particular, the method, system and apparatus measure the magnetic characteristics of the thick magnetic sample by irradiating the sample with X-ray, and detecting transmissive X-ray passing through the sample.
Public/Granted literature
- US20150084622A1 MAGNETIC MEASUREMENT METHOD AND ITS SYSTEM AND APPARATUS Public/Granted day:2015-03-26
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