Invention Grant
- Patent Title: Abnormality diagnostic device and abnormality diagnostic method for MOSFET switch element
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Application No.: US15021582Application Date: 2014-06-30
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Publication No.: US09766292B2Publication Date: 2017-09-19
- Inventor: Shinji Hirose , Mamoru Kuraishi , Tomoyuki Ito , Kazuhiro Niimura , Kenji Nishigaki , Junichi Hatano , Satoshi Yamamoto , Yusuke Tsutsui
- Applicant: KABUSHIKI KAISHA TOYOTA JIDOSHOKKI
- Applicant Address: JP Kariya-shi, Aichi
- Assignee: KABUSHIKI KAISHA TOYOTA JIDOSHOKKI
- Current Assignee: KABUSHIKI KAISHA TOYOTA JIDOSHOKKI
- Current Assignee Address: JP Kariya-shi, Aichi
- Agency: Sughrue Mion, PLLC
- Priority: JP2013-193594 20130919; JP2014-053305 20140317
- International Application: PCT/JP2014/067341 WO 20140630
- International Announcement: WO2015/040923 WO 20150326
- Main IPC: H02J7/00
- IPC: H02J7/00 ; G01R31/327 ; G01R31/02 ; H01M10/48 ; H03K17/082 ; H02H3/087 ; H02H7/18

Abstract:
An abnormality diagnostic for a MOSFET switch element in a rechargeable battery pack for determining a short circuit abnormality (fusion) in a MOSFET switch element that causes a charge current to flow in. An on/off controller turns off a MOSFET causing a charge current to flow into a battery module, a start-of-charge instruction unit transmits to a charger an instruction signal to start a charging operation, and a short circuit abnormality diagnostic unit determines, based on a current sensor output, whether current is flowing through the MOSFET due to the charging operation to diagnose a short circuit abnormality in the MOSFET. After diagnosis of the MOSFET, a diagnosis of a short circuit abnormality in a MOSFET that causes a discharge current to flow out of the battery module is performed, and then a diagnosis of a short circuit abnormality in a charge relay is performed.
Public/Granted literature
- US20160231382A1 ABNORMALITY DIAGNOSTIC DEVICE AND ABNORMALITY DIAGNOSTIC METHOD FOR MOSFET SWITCH ELEMENT Public/Granted day:2016-08-11
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