Invention Grant
- Patent Title: Method for determining mask pattern, non-transitory recording medium, and information processing apparatus
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Application No.: US14184611Application Date: 2014-02-19
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Publication No.: US09766539B2Publication Date: 2017-09-19
- Inventor: Ryo Nakayama , Yuichi Gyoda
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: CANON KABUSHIKI KAISHA
- Current Assignee: CANON KABUSHIKI KAISHA
- Current Assignee Address: JP Tokyo
- Agency: Canon USA, Inc., IP Division
- Priority: JP2013-033509 20130222
- Main IPC: G03F1/70
- IPC: G03F1/70 ; G03F7/20

Abstract:
A method which determines patterns for a plurality of masks to be executed by a processor includes acquiring data on a pattern containing a plurality of pattern elements, and assigning the acquired plurality of pattern elements into masks, decomposing the acquired plurality of pattern elements into patterns of the masks, and calculating an evaluation value for an evaluation index, based on a number of masks, the distances between a plurality of pattern elements in each mask, and an angle of a line connecting a plurality of pattern elements in each mask. In the method, a pattern of each mask is determined based on the calculated evaluation value.
Public/Granted literature
Information query
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