Invention Grant
- Patent Title: Test size reduction using don't care analysis
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Application No.: US14477735Application Date: 2014-09-04
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Publication No.: US09767412B2Publication Date: 2017-09-19
- Inventor: Hiroaki Yoshida , Cuong Nguyen , Indradeep Ghosh
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Maschoff Brennan
- Main IPC: G06N5/04
- IPC: G06N5/04

Abstract:
Systems and methods are disclosed to determine “don't care” variables in programming code. The method comprises obtaining an SMT formula having a plurality of SMT variables from programming code; obtaining a simplified SMT formula from the SMT formula, the simplified SMT formula includes a plurality of simplified SMT variables; obtaining an SAT formula from the simplified SMT formula, the SAT formula includes a plurality of SAT variables; determining which of the plurality of the SMT variables are “don't care” variables from the simplified SMT formula; and determining which of the plurality of the SMT variables are “don't care” variables from the simplified SAT formula.
Public/Granted literature
- US20160071012A1 TEST SIZE REDUCTION USING DON'T CARE ANALYSIS Public/Granted day:2016-03-10
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