Invention Grant
- Patent Title: Method and device for analysing a region of interest in an object using x-rays
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Application No.: US13989507Application Date: 2011-12-05
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Publication No.: US09767550B2Publication Date: 2017-09-19
- Inventor: Ingwer-Curt Carlsen , Thomas Koehler , Gerhard Martens , Ewald Rossl , Rafael Wiemker
- Applicant: Ingwer-Curt Carlsen , Thomas Koehler , Gerhard Martens , Ewald Rossl , Rafael Wiemker
- Applicant Address: NL Eindhoven
- Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP10194734 20101213
- International Application: PCT/IB2011/055463 WO 20111205
- International Announcement: WO2012/080900 WO 20120621
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00 ; G01N23/04

Abstract:
A method and a device for analyzing a region of interest in an object is proposed. The method comprises: (a) providing measurement data by a differential phase contrast X-ray imaging system, and (b) analyzing characteristics of the object in the region of interest. Therein, the measurement data comprise a 2-dimensional or 3-dimensional set of pixels wherein for each pixel the measurement data comprises three types of image data spatially aligned with each other, including (i) absorption representing image data A, (ii) differential phase contrast representing image data D, and (iii) coherence representing image data C. The analyzing step is based, for each pixel, on a combination of at least two of information comprised in the absorption representing image data A and information comprised in the differential phase contrast representing image data D and information comprised in the coherence representing image data C.
Public/Granted literature
- US20130236079A1 METHOD AND DEVICE FOR ANALYSING A REGION OF INTEREST IN AN OBJECT USING X-RAYS Public/Granted day:2013-09-12
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