Invention Grant
- Patent Title: Method for forming tunnel MOSFET with ferroelectric gate stack
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Application No.: US15195620Application Date: 2016-06-28
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Publication No.: US09768030B2Publication Date: 2017-09-19
- Inventor: Min-Hung Lee
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd. , National Taiwan University
- Applicant Address: TW Hsin-Chu TW Taipei
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.,National Taiwan University
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.,National Taiwan University
- Current Assignee Address: TW Hsin-Chu TW Taipei
- Agency: Slater Matsil, LLP
- Main IPC: H01L21/28
- IPC: H01L21/28 ; H01L29/51 ; H01L29/66 ; H01L21/02 ; H01L29/739 ; H01L21/8234 ; H01L21/8238 ; H01L29/10 ; H01L29/78

Abstract:
A Tunnel Field-Effect Transistor (TFET) includes a source region in a semiconductor substrate, and a drain region in the semiconductor substrate. The source region and the drain region are of opposite conductivity types. The TFET further includes a gate stack over the semiconductor substrate, with the source region and the drain region extending to opposite sides of the gate stack. The gate stack includes a gate dielectric over the semiconductor substrate, and a ferroelectric layer over the gate dielectric.
Public/Granted literature
- US20160308021A1 Tunnel MOSFET with Ferroelectric Gate Stack Public/Granted day:2016-10-20
Information query
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