Invention Grant
- Patent Title: Method and device for highly-precise measurement of surfaces
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Application No.: US14422338Application Date: 2013-08-20
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Publication No.: US09772182B2Publication Date: 2017-09-26
- Inventor: Christian Am Weg , Thilo May , Ralf Nicolaus , Jurgen Petter , Gernot Berger
- Applicant: LUPHOS GMBH
- Applicant Address: DE Mainz
- Assignee: LUPHOS GMBH
- Current Assignee: LUPHOS GMBH
- Current Assignee Address: DE Mainz
- Agency: Christopher C. Dremann, P.C.
- Agent Christopher C. Dremann
- Priority: DE102012017015 20120820
- International Application: PCT/EP2013/002500 WO 20130820
- International Announcement: WO2014/029495 WO 20140227
- Main IPC: G01C3/08
- IPC: G01C3/08 ; G01B11/30 ; G01B21/04 ; G01B11/24 ; G01S17/08

Abstract:
A device for measuring at least one surface portion of an object has a holder on which a reference body and a distance measuring device are arranged. The distance measuring device is pivotally mounted on the holder relative to a first axis and relative to a second axis. The distance measuring device is operable to determine a distance from a first point located on the surface portion of the object and a second distance from a second point located on the reference body.
Public/Granted literature
- US20150226548A1 METHOD AND DEVICE FOR HIGHLY-PRECISE MEASUREMENT OF SURFACES Public/Granted day:2015-08-13
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