Invention Grant
- Patent Title: Tool abnormality determination system
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Application No.: US14373245Application Date: 2012-09-14
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Publication No.: US09772256B2Publication Date: 2017-09-26
- Inventor: Shinya Kumazaki , Kazuya Furukawa , Atsushi Kamiya
- Applicant: Shinya Kumazaki , Kazuya Furukawa , Atsushi Kamiya
- Applicant Address: JP Chiryu-shi
- Assignee: FUJI MACHINE MFG. CO., LTD.
- Current Assignee: FUJI MACHINE MFG. CO., LTD.
- Current Assignee Address: JP Chiryu-shi
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2012-009244 20120119
- International Application: PCT/JP2012/073735 WO 20120914
- International Announcement: WO2013/108435 WO 20130725
- Main IPC: G01M13/00
- IPC: G01M13/00 ; B23Q17/09 ; G01M99/00

Abstract:
A tool abnormality determination system is provided. The tool abnormality determination system includes: a tool that machines a workpiece; a control device that includes a storage portion in which a monitoring range is stored and an arithmetic portion for comparing the monitoring range to a load of the tool during machining; and an interface device that can notify, when the load of the tool exceeds the monitoring range, an operator of a question regarding whether or not the tool is in an abnormal condition other than abrasion.
Public/Granted literature
- US20140365177A1 TOOL ABNORMALITY DETERMINATION SYSTEM Public/Granted day:2014-12-11
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