Invention Grant
- Patent Title: Preparation of sample for charged-particle microscopy
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Application No.: US15052313Application Date: 2016-02-24
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Publication No.: US09772265B2Publication Date: 2017-09-26
- Inventor: Hervé-William Rémigy
- Applicant: FEI Company
- Applicant Address: US OR Hillsboro
- Assignee: FEI Company
- Current Assignee: FEI Company
- Current Assignee Address: US OR Hillsboro
- Agency: Scheinberg & Associates, P.C.
- Agent Michael O. Scheinberg
- Priority: EP15156546 20150225
- Main IPC: H01J37/26
- IPC: H01J37/26 ; H01J37/20 ; G01N1/28 ; G01N1/42

Abstract:
A system and method for preparing a sample for study in a charged-particle microscope is disclosed. A sample holder comprises substantially parallel opposing faces connected by apertures spanned by a perforated membrane. Blotting material is placed against the outer membrane surface, and liquid films may then be deposited onto the inner membrane surface within each aperture where each aperture can contain a unique sample. Liquids from each sample flow through the perforations in the membrane to be absorbed by the blotting material. After completion of deposition of liquid samples, the sample holder is raised off the blotting material, leaving aqueous samples within the perforations of the membrane. The sample holder may then be immersed in a vitrifying bath of liquid oxygen to form a cryo-sample for microscopic imaging and analysis.
Public/Granted literature
- US20160245732A1 PREPARATION OF SAMPLE FOR CHARGED-PARTICLE MICROSCOPY Public/Granted day:2016-08-25
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