Invention Grant
- Patent Title: RF probe
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Application No.: US14739314Application Date: 2015-06-15
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Publication No.: US09772350B2Publication Date: 2017-09-26
- Inventor: Randy Barsatan
- Applicant: Advantest Corporation
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Main IPC: G01R1/067
- IPC: G01R1/067 ; G01R31/319 ; G01R31/28

Abstract:
Embodiments of the present invention provide an RF probe for coupling out a probe signal from a transmission line of a circuit. The RF probe includes at least two probe pins having first ends for contacting the circuit and second ends. Furthermore, the RF probe includes a provider for providing a variable impedance at the second ends of the probe pins. The RF probe is configured to provide the probe signal based on a signal propagating along at least one of the probe pins.
Public/Granted literature
- US20150276809A1 RF Probe Public/Granted day:2015-10-01
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