Shunt arrangements and current measuring circuits are provided for temperature compensated current measurements as well as current measurements that are compensated for changes in the characteristics of the shunt material as a result of manufacturing tolerances. The current measuring circuits may include a temperature sensing element in a negative feedback path of an operational amplifier for providing temperature compensation. The shunt arrangements may include a calibration shunt formed in the same material as a main shunt and circuitry for measuring the temperature drift error of the calibration shunt and applying that error to compensate for temperature drift of the main shunt.