Invention Grant
- Patent Title: Image measurement device
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Application No.: US15465625Application Date: 2017-03-22
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Publication No.: US09772480B2Publication Date: 2017-09-26
- Inventor: Hayato Oba
- Applicant: Keyence Corporation
- Applicant Address: JP Osaka
- Assignee: Keyence Corporation
- Current Assignee: Keyence Corporation
- Current Assignee Address: JP Osaka
- Agency: Kilyk & Bowersox, P.L.L.C.
- Priority: JP2014-037539 20140227
- Main IPC: G02B21/00
- IPC: G02B21/00 ; G02B21/06 ; G01B11/24 ; G02B21/36 ; G01B11/02 ; G02B21/26 ; G06T7/00 ; H04N5/225 ; H04N7/18

Abstract:
The image measurement device includes: a measurement target place specifying part that specifies a measurement target place on a workpiece image based on a user's operation; an illumination condition storage part that holds two or more illumination conditions; an imaging control part that controls a camera and an illumination device to acquire two or more of the workpiece images sequentially photographed while making the illumination condition different; a workpiece image display part that displays the acquired plurality of workpiece images; a workpiece image selecting part that selects any one of the displayed workpiece images; an illumination condition deciding part that decides the illumination condition based on the selected workpiece image; and a dimension calculating part that extracts an edge of the measurement target place based on the workpiece image photographed on the decided illumination condition, and obtains a dimension of the measurement target place based on the extracted edge.
Public/Granted literature
- US20170192215A1 Image Measurement Device Public/Granted day:2017-07-06
Information query