Systems and methods for detecting camera defect caused by exposure to radiation
Abstract:
A method of detecting camera defect includes: obtaining an image by a processing unit, the processing unit having a surface fit module, a subtraction module, and a peak quantification module; determining a first autocorrelation map for a first sub-region in the image; determining, using the surface fit module, a first surface fit for first scene content in the first sub-region; subtracting, using the subtraction module, the first surface fit from the first autocorrelation map for the first sub-region in the image to obtain a first residual map; and quantifying, using the peak quantification module, a first noise in the first residual map.
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