Invention Grant
- Patent Title: Manufacturing method of an amorphous-silicon flat-panel X-ray sensor
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Application No.: US13995424Application Date: 2012-10-29
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Publication No.: US09773938B2Publication Date: 2017-09-26
- Inventor: Shaoying Xu , Zhenyu Xie , Jian Guo , Xu Chen
- Applicant: Beijing BOE Optoelectronics Technology Co., Ltd.
- Applicant Address: CN Beijing
- Assignee: BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee: BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Beijing
- Priority: CN201210206267 20120618
- International Application: PCT/CN2012/083711 WO 20121029
- International Announcement: WO2013/189139 WO 20131227
- Main IPC: H01L21/84
- IPC: H01L21/84 ; H01L31/18 ; H01L31/105 ; H01L27/146

Abstract:
An embodiment of the present invention provides a manufacturing method of an amorphous-silicon flat-panel X-ray sensor; the method reduces the number of mask plates to be used, simplifies the production processes, saves production costs, while also improving the product yield. The manufacturing method comprises: on a substrate, after a gate scan line is formed, forming a data line, a TFT switch element and a photosensitive element through one patterning process, wherein on the mask plate used in the patterning process, a region corresponding to a channel of the TFT switch element is semi-transmissive, whereas regions respectively corresponding to the data line, the photosensitive element and the portion of the TFT switch element other than the channel thereof are non-transmissive; thereafter, on the substrate formed with the TFT switch element and the photosensitive element, a passivation layer and a bias line are formed.
Public/Granted literature
- US20140087510A1 Manufacturing Method Of An Amorphous-Silicon Flat-Panel X-Ray Sensor Public/Granted day:2014-03-27
Information query
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