Invention Grant
- Patent Title: Built-in self test for loopback on communication system on chip
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Application No.: US15406230Application Date: 2017-01-13
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Publication No.: US09774391B2Publication Date: 2017-09-26
- Inventor: Radhakrishnan L. Nagarajan
- Applicant: INPHI CORPORATION
- Applicant Address: US CA Santa Clara
- Assignee: INPHI CORPORATION
- Current Assignee: INPHI CORPORATION
- Current Assignee Address: US CA Santa Clara
- Agency: Ogawa P.C.
- Agent Richard T. Ogawa
- Main IPC: H04B10/071
- IPC: H04B10/071 ; H04L12/26 ; H04L12/933 ; H04Q11/00 ; H04B10/40

Abstract:
In an example, the present invention includes an integrated system-on-chip device. The device is configured on a single silicon substrate member. The device has a data input/output interface provided on the substrate member. The device has an input/output block provided on the substrate member and coupled to the data input/output interface. The device has a signal processing block provided on the substrate member and coupled to the input/output block. The device has a driver module provided on the substrate member and coupled to the signal processing block. In an example, the device has a driver interface provided on the substrate member and coupled to the driver module and configured to be coupled to a silicon photonics device. In an example, a control block is configured to receive and send instruction(s) in a digital format to the communication block and is configured to receive and send signals in an analog format to communicate with the silicon photonics device.
Public/Granted literature
- US20170141843A1 BUILT-IN SELF TEST FOR LOOPBACK ON COMMUNICATION SYSTEM ON CHIP Public/Granted day:2017-05-18
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