Invention Grant
- Patent Title: Differential polarization interferometer
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Application No.: US14929374Application Date: 2015-11-01
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Publication No.: US09778019B2Publication Date: 2017-10-03
- Inventor: Alexander Vasilevich Agashkov , Nikolai Stanislavovich Kazak , Vladimir Enokovich Agabekov , Marzook Saleh O Alshammari , Mohammed A Binhussain
- Applicant: King Abdul Aziz City for Science and Technology , B.I. Stepanov Institute of Physics of the National Academy of Sciences of Belarus , Institute of Chemistry of New Materials of National Academy of Sciences of Belarus
- Applicant Address: SA Riyadh
- Assignee: King Abdulaziz City for Science and Technology-KACST
- Current Assignee: King Abdulaziz City for Science and Technology-KACST
- Current Assignee Address: SA Riyadh
- Agency: Timberline Patent Law Group PLLC
- Main IPC: G01B9/02
- IPC: G01B9/02 ; G01J9/02

Abstract:
A differential polarization interferometer is provided. An interferometer performs direct measurement of phase shift of a light wave passed under an arbitrary angle through a sample composed of a transparent substrate holding a thin deposited test film, for metamaterial testing. An example apparatus has a laser source and a first polarizer, and two optically connected arms. A first arm creates orthogonally polarized components of a single output beam for a broadband non-polarizing beam splitter. A second arm has a controllable phase retarder to introduce a phase shift into one polarization component of the reflected single output beam, and a second polarizer to equalize and mix the polarization components of the reflected single output beam. This transforms the reflected single output beam into a beam resulting from interference of polarization components of the reflected single output beam. A photodetector transforms an intensity of the beam into an electric signal for output.
Public/Granted literature
- US20160231099A1 DIFFERENTIAL POLARIZATION INTERFEROMETER Public/Granted day:2016-08-11
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