Invention Grant
- Patent Title: Rotation angle measurement device and rotation angle measurement method
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Application No.: US15138786Application Date: 2016-04-26
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Publication No.: US09778075B2Publication Date: 2017-10-03
- Inventor: Toru Shimizu , Nobuyuki Osawa , Takashi Fujita
- Applicant: Tokyo Seimitsu Co., Ltd.
- Applicant Address: JP Hachioji-Shi, Tokyo
- Assignee: Tokyo Seimitsu Co., Ltd.
- Current Assignee: Tokyo Seimitsu Co., Ltd.
- Current Assignee Address: JP Hachioji-Shi, Tokyo
- Agency: Banner & Witcoff, Ltd.
- Priority: JP2012-030828 20120215; JP2012-245265 20121107
- Main IPC: G01D5/34
- IPC: G01D5/34 ; G01D5/26 ; G01D5/347

Abstract:
A rotation angle measurement device includes: relative angle detection means including a reference support whose rotation is regulated in a fixed range in an arbitrary direction of a rotation axis, and a driving rotating body which is coupled to the reference support and is axially supported so as to be all-round rotatable with respect to the reference support, the relative angle detection means which detects a relative rotation angle of the rotating body with respect to the reference support; and non-contact angle detection means which detects a rotation angle of the reference support with reference to a position that does not contact with the rotating body and the reference support. This provides improved accuracy in indexing the rotation angle of a rotating moving shaft and easy installation onto the rotating moving shaft.
Public/Granted literature
- US20160238413A1 Rotation Angle Measurement Device and Rotation Angle Measurement Method Public/Granted day:2016-08-18
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