Invention Grant
- Patent Title: Method of measuring characteristics of crystal unit
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Application No.: US14875988Application Date: 2015-10-06
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Publication No.: US09778096B2Publication Date: 2017-10-03
- Inventor: Masakazu Kishi , Hajime Kubota , Masayuki Itoh
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: JP2014-224994 20141105
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01H9/00 ; G01H11/08

Abstract:
A method of measuring characteristics of a crystal unit, includes: driving a crystal unit having a cover transmitting light, a crystal substrate, a first excitation electrode disposed on a first surface of the crystal substrate facing the cover, and a second excitation electrode disposed on a second surface of the crystal substrate opposite to the first surface; irradiating light to the first excitation electrode through the cover in the driving state of the crystal unit; and measuring vibration characteristics of the crystal unit based on reflected light obtained from the irradiated light.
Public/Granted literature
- US20160123797A1 METHOD OF MEASURING CHARACTERISTICS OF CRYSTAL UNIT Public/Granted day:2016-05-05
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