Invention Grant
- Patent Title: Metrology system and method having a plurality of sensors for estimating a spectral feature of a pulsed light beam
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Application No.: US14720207Application Date: 2015-05-22
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Publication No.: US09778108B2Publication Date: 2017-10-03
- Inventor: Joshua Thornes
- Applicant: Cymer, LLC
- Applicant Address: US CA San Diego
- Assignee: Cymer, LLC
- Current Assignee: Cymer, LLC
- Current Assignee Address: US CA San Diego
- Agency: DiBerardino McGovern IP Group LLC
- Main IPC: G01J3/28
- IPC: G01J3/28 ; G01J3/26 ; G01J3/18 ; G01J9/00 ; G01J3/02

Abstract:
A metrology system includes an optical frequency separation apparatus in the path of the pulsed light beam and configured to interact with the pulsed light beam and output a plurality of spatial components that correspond to the spectral components of the pulsed light beam; a plurality of sensing regions that receive and sense the output spatial components; and a control system connected to an output of each sensing region. The control system is configured to: measure, for each sensing region output, a property of the output spatial components from the optical frequency separation apparatus for one or more pulses; analyze the measured properties including averaging the measured properties to calculate an estimate of the spectral feature of the pulsed light beam; and determine whether the estimated spectral feature of the pulsed light beam is within an acceptable range of values of spectral features.
Public/Granted literature
- US20160341602A1 Spectral Feature Metrology of a Pulsed Light Beam Public/Granted day:2016-11-24
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