Invention Grant
- Patent Title: Analysis apparatus
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Application No.: US14975970Application Date: 2015-12-21
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Publication No.: US09778148B2Publication Date: 2017-10-03
- Inventor: Heihachiro Taniguchi , Takuji Kurozumi , Takahiro Yamada , Yasushi Hirata
- Applicant: HORIBA, Ltd.
- Applicant Address: JP Kyoto-shi
- Assignee: HORIBA, LTD.
- Current Assignee: HORIBA, LTD.
- Current Assignee Address: JP Kyoto-shi
- Agency: Carter, DeLuca, Farrell & Schmidt, LLP
- Agent Robert P. Michal, Esq.
- Priority: JP2014-264184 20141226
- Main IPC: G01N1/22
- IPC: G01N1/22 ; G01N1/40 ; G01N31/12 ; G01N21/3504 ; G01N33/20

Abstract:
In order to remove dust attached to a filter member 40 to surely clean the filter member 40, an analysis apparatus 100 includes: a sample containing part 10 that contains a sample; the filter member 40 through which gas produced from the sample heated in the sample containing part 10 passes; and a gas flow path L1 adapted to lead the gas having passed through the filter member 40 to an analyzer. In addition, the filter member 40 is formed in a tubular shape, and in one end part of the filter member 40, a gas lead-out port 40a connecting to the gas flow path L1 is formed. Further, it is configured that the gas passes through a side wall part 42 of the filter member 40 from outside to inside, and flows from the gas lead-out port 40a to the gas flow path L1.
Public/Granted literature
- US20160187232A1 ANALYSIS APPARATUS Public/Granted day:2016-06-30
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