Invention Grant
- Patent Title: X-ray analyzing apparatus
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Application No.: US15458326Application Date: 2017-03-14
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Publication No.: US09778214B2Publication Date: 2017-10-03
- Inventor: Yukio Sako
- Applicant: RIGAKU CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Rigaku Corporation
- Current Assignee: Rigaku Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2014-190249 20140918
- Main IPC: G01N23/223
- IPC: G01N23/223 ; G01T1/17

Abstract:
The X-ray analyzing apparatus according to the present invention includes, in combination: a first correcting unit (13A, 13B) to output a first gain to cause a pulse height of a target peak which is estimated on the basis of a sum of counting rates obtained in preliminary measurement, to match a predetermined expected pulse height; and a second correcting unit (14A, 14B) to output, in real time through feedback control, a second gain to be added to the first gain in order to cause the pulse height of the target peak detected within a predetermined energy range, to match the expected pulse height, and further includes a feedback control stopping unit (16A, 16B) to appropriately determine presence/absence of an interfering line with respect to the target peak, and to set, when determining that the interfering line exists, the gain to a fixed value including only the first gain.
Public/Granted literature
- US20170184519A1 X-RAY ANALYZING APPARATUS Public/Granted day:2017-06-29
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