Invention Grant
- Patent Title: Automatic analyzer
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Application No.: US14438250Application Date: 2013-11-11
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Publication No.: US09778274B2Publication Date: 2017-10-03
- Inventor: Takao Shiba , Yoshiyuki Tanaka , Eiichi Matsubara
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Matingly & Malur, PC
- Priority: JP2012-250350 20121114
- International Application: PCT/JP2013/080454 WO 20131111
- International Announcement: WO2014/077219 WO 20140522
- Main IPC: G01N35/02
- IPC: G01N35/02 ; G01N35/00 ; G01N35/04

Abstract:
An automatic analyzer having no limitation on a range of a placeable position on a sample placement disk for patient specimens, emergency specimens, quality control samples, and calibration samples, and being capable of performing analysis while changing the number of simultaneously-measurable samples for each type of each specimen is provided. In the automatic analyzer, either a calibration sample dedicated disk or a patient specimen dedicated disk is placed in an analyzing unit 8 as a sample placement disk 19, and the analyzing unit 8 has a disk identifying unit 24 which identifies a type of the sample placement disk 19, and a computer 22 identifies the type of the sample placement disk 19 based on an identification result of the disk identifying unit 24, and performs analysis on a liquid sample based on the identified type of the sample placement disk 19.
Public/Granted literature
- US20150293136A1 AUTOMATIC ANALYZER Public/Granted day:2015-10-15
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