Invention Grant
- Patent Title: Method of detecting unique portion and method of setting address point of measuring apparatus using the same
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Application No.: US15069658Application Date: 2016-03-14
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Publication No.: US09779493B2Publication Date: 2017-10-03
- Inventor: Hyungjoon Cho
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si, Gyeonggi-Do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2015-0113387 20150811
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00

Abstract:
A method of setting an address point (AP) of a measuring apparatus includes generating an original image using design data, generating a first simplified image by extending sizes of patterns in the original image, searching for at least one vertex in the first simplified image, and setting a predetermined region including the at least one vertex as the AP upon locating the at least one vertex.
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