Invention Grant
- Patent Title: Bipolar junction transistor formed on fin structures
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Application No.: US15237226Application Date: 2016-08-15
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Publication No.: US09780003B2Publication Date: 2017-10-03
- Inventor: Chia-Hsin Hu , Min-chang Liang , Sun-Jay Chang , Shien-Yang Wu
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Haynes and Boone, LLP
- Main IPC: H01L21/8249
- IPC: H01L21/8249 ; H01L29/417 ; H01L27/06 ; H01L29/423 ; H01L29/66 ; H01L29/732 ; H01L29/06 ; H01L29/10 ; H01L29/735

Abstract:
A method of forming a Bipolar Junction Transistor (BJT) includes forming an elongated collector line, forming an elongated emitter line parallel to the collector line, and forming an elongated base line parallel to the collector line and positioned between the collector line and the base line. The emitter line, the base line, and the collector line are formed over fin structures.
Public/Granted literature
- US20160358822A1 Bipolar Junction Transistor Formed on Fin Structures Public/Granted day:2016-12-08
Information query
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