Invention Grant
- Patent Title: Semiconductor device and method for manufacturing the same
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Application No.: US14828830Application Date: 2015-08-18
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Publication No.: US09780111B2Publication Date: 2017-10-03
- Inventor: Takeshi Ishizaki , Junichi Wada , Atsuko Sakata , Kei Watanabe , Masayuki Kitamura , Daisuke Ikeno , Satoshi Wakatsuki , Hirotaka Ogihara , Shinya Okuda
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Tokyo
- Assignee: Toshiba Memory Corporation
- Current Assignee: Toshiba Memory Corporation
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: JP2015-078949 20150408
- Main IPC: H01L29/792
- IPC: H01L29/792 ; H01L27/11582 ; H01L27/1157

Abstract:
According to one embodiment, a semiconductor device includes a substrate, a stacked body, a film having semi-conductivity or conductivity, and a memory film. The stacked body includes a plurality of metal layers, a plurality of insulating layers, and a plurality of intermediate layers stacked on a major surface of the substrate. The film extends in the stacked body in a stacking direction of the stacked body. The memory film is provided between the film and the metal layers. The metal layers are tungsten layers and the intermediate layers are tungsten nitride layers. Or the metal layers are molybdenum layers and the intermediate layers are molybdenum nitride layers.
Public/Granted literature
- US20160300845A1 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME Public/Granted day:2016-10-13
Information query
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