Invention Grant
- Patent Title: Method of manufacturing semiconductor device and semiconductor device
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Application No.: US15307608Application Date: 2015-04-20
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Publication No.: US09780163B2Publication Date: 2017-10-03
- Inventor: Yuki Horiuchi , Satoru Kameyama
- Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHA
- Applicant Address: JP Toyota
- Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
- Current Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
- Current Assignee Address: JP Toyota
- Agency: Oliff PLC
- Priority: JP2014-125925 20140619
- International Application: PCT/JP2015/062016 WO 20150420
- International Announcement: WO2015/194250 WO 20151223
- Main IPC: H01L23/58
- IPC: H01L23/58 ; H01L29/06 ; H01L21/265 ; H01L21/324 ; H01L21/225 ; H01L29/861

Abstract:
A structure having high, middle, and low impurity concentration regions disposed from a surface side of a substrate is more suitably manufactured. A method of manufacturing a semiconductor device includes: a first implantation of first conductivity type impurities into a first conductivity type semiconductor substrate from a surface; melting and solidifying a first semiconductor region between a depth and the surface, wherein the depth is deeper than a depth having a peak impurity concentration in an increased region where the impurity concentration was increased in the first implantation, and shallower than a deeper end of the increased region; a second implantation of the impurities from the surface into a region shallower than the depth; and melting and solidifying a region in which the impurity concentration was increased in the second implantation.
Public/Granted literature
- US20170092714A1 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE Public/Granted day:2017-03-30
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