Invention Grant
- Patent Title: Runway measurement system and method
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Application No.: US13508888Application Date: 2009-11-10
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Publication No.: US09784579B2Publication Date: 2017-10-10
- Inventor: Juha Sunio , Jonna Nousiainen , Matti Pekkarinen
- Applicant: Juha Sunio , Jonna Nousiainen , Matti Pekkarinen
- Applicant Address: FI Hyvinkää
- Assignee: KONECRANES GLOBAL CORPORATION
- Current Assignee: KONECRANES GLOBAL CORPORATION
- Current Assignee Address: FI Hyvinkää
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- International Application: PCT/FI2009/050904 WO 20091110
- International Announcement: WO2011/058212 WO 20110519
- Main IPC: H04N7/18
- IPC: H04N7/18 ; G01C15/00 ; B61L23/04

Abstract:
A measuring system comprising a fixed measurement unit (101), a data processing unit (130) and a mobile unit (120). The mobile unit comprises a planar base (111), a reflector (118), an elevation element (119) fixed to the base and the reflector, and attaching the reflector to a fixed position in respect of the base. The mobile unit comprises also mobility means (112) for moving the base along a surface (113) such that the spatial orientation of the base (114) substantially corresponds with the spatial orientation of the currently underlying part of the surface. In addition the mobile unit comprises tilt measuring means (123) for determining a deviation between the spatial orientation of the base and a plane perpendicular to the ambient gravitational force, and tilt elimination means for eliminating the effect of the determined deviation. Measurement results are thus more accurate.
Public/Granted literature
- US20120224056A1 RUNWAY MEASUREMENT SYSTEM AND METHOD Public/Granted day:2012-09-06
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